Not claiming I am competent to do this I would like to try to summarize in limited amount of words what this thread has provided
It adds value for VNA measurement, due to its internal transform, to understand the impact of the magnitude of measurement errors (such as noise) or not well characterized calibration standards on the calculated values, in particular to understand the impact pending the position on the Smith chart. (referring to the DERR part of the communication)
It is possible to formulate an elegant, rather compact formula to calculate G solely based on g,s,o,l,S,O and L
It is possible and it makes sense to compare 1 port (S11) measurement performance of two VNA's measuring the same load if these have been calibrated using the same calibration standards and approach (this is regardless if this has been done using SOL or any other calibration approach, the use includes the utilization of the description of the used calibration standards, either as perfect, parameter modeled or data based) as the results of these measurements should be equal.
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NanoVNA Wiki:
/g/nanovna-users/wiki/homeNanoVNA Files:
/g/nanovna-users/filesErik, PD0EK
