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Re: |S11| > 1

 

Thanks to DAve W0LEV and others for bring up the subject of error analysis and significant figures.
My own background is like Dave¡¯s; a physics degree in 1965. Our professor in senior labs was very big on
error analysis. It¡¯s a hard subject. I asked at our local hospital regarding uncertainty and error in lab tests.
I never got a good answer.
A friend of mine, an engineering professor, made a joke ¡­. ¡°If you want to be absolutely certain about a measurement, only measure once.¡± Do I need to explain?

Chuck KF8TI

On Jun 14, 2022, at 1:49 PM, Jim Lux <jim@...> wrote:

On 6/14/22 9:24 AM, W0LEV wrote:
Thank you, Jim!!!

Again, we are not running a metrology lab nor do our measurements approach
those of HP, R&S, Tek, and others. Something my PhD friends tell me is
that error analysis and assignment of error bars is no longer taught - not
even at CU/Boulder. I had a required course dedicated to that musing to
obtain my Physics degree some 50+ years ago at Michigan State U.

The students today have no idea how the error bar is established or even
what it truly indicates. Several of us have tried introducing our STEM
students at LTO (Little Thompson Observatory <starkids.org>) to the concept
of measurement errors and how they affect final outcomes. We usually get
wrinkled foreheads and "why".

Yes, 5 parts in E-5 is -86 dB. Yes, the HP 8753C noise floor can measure
below that. But, not our inexpensive NANOVNAs. Mine typically shows a
noise floor of -60 dB, depending on frequency and measurement type.

Again, thank you to those who put these VNAs at a reachable price in the
hands of us amateurs and those who want to learn the "fine points" of RF
engineering.

Never measure the temperature with more than one thermometer.

Never determine the time of day with more than one Cesium clock.

Never determine _________with more than one _________.

Dave - W?LEV

"sig figs" is taught in high school and undergrad.

If you do any sort of hard science classes they cover measurement uncertainties as part of the class (e.g. in lab) - Most lab classes discuss this (Undergrad chem lab certainly does).

The more sophisticated stuff is covered in classes like numerical analysis - if you're doing signal processing, for instance, round off and error propagation are a big thing. Same with classes on numerical solutions of differential equations, in connection with things like Runge-Kutta. I doubt there's many classes that specifically care about "calibration uncertainty" - you're on your own with mfr notes and the professional literature.

As a grad student, you'd be expected to get this knowledge in some way - there are a variety of short courses offered by various government labs as well as industry. For instance NIST has annual meeting in certain fields, and there's often some short courses associated with it.











Re: NanoVNA for RFID design

 

Dave,

I don't normally post here (although I read everything via email).
I just want to thank you for your very informative history of RFID. It's something I've worked with for a number of years but never heard the history like thhis.\

Jerry, AI0K


Re: |S11| > 1

 

I do not have a VNA. I rely on Rudy Severns, N6LF, for data. He recalibrated his VNA at the SMA connector, measured a short there, and now MA mode does not affect the file data. In addition, |S11| is no longer greater than 1.

Sorry for the confusion. I would delete my original post if I could.

Brian


Re: NanoVNA for RFID design

 

I am one of several engineers who worked for the company that originally
introduced RFID to the world, AMTEK. They no longer exist as many
start-ups go. The company was fresh off "The Hill", Los Alamos, where RFID
was originally developed to log and to some extent, track, Pu and other
radioactive carrying trucks. Dr. Gary Seawright purchased the patent
rights from Los Alamos and formed the company. Those systems operated in
the 915 MHz and 2.45 GHz ISM bands with an experimental license from the
FCC. When AMTEK was bought out by the Texans (that was the end of a good
beginning!!), Gary resigned. Another engineer, Dr. Jerry Landt, also left
shortly after. Jerry wrote and still participates in authoring most of the
RFID standards we have today for the RFID industry. The rest is
history........

So much for history. I was there. However your system is a low-frequency
inductively coupled system that likely operates below 150 kHz. Even though
the coupling element is referred to as an "antenna" is it not. You are
dealing with inductive coupling between the tag or badge and the reader
coils. I did not work on these systems, but am quite familiar with them
from much later work before I retired.

I note the required equipment lists only a Network Analyzer. There is a
big difference between a Scalar and Vector network analyzer, both in
performance and cost. The NANOVNAs are vector analyzers, but can be used
as a scalar analyzer as well. A scalar analyzer can not produce Smith
Charts as it does not measure the angle of the measurements and, therefore,
can not represent complex impedances or deal with Smith charts. That is
accomplished with a VECTOR network analyzer which is far more complex and
dwells with the Smith Chart. So,........., if there is no need for
measuring complex portions of the impedances of the antennas (inductors)
(which I do not read in AN4974) you're off the hook for a lot of complex
arithmetic and the Smith Chart!

Dave - W?LEV

On Tue, Jun 14, 2022 at 8:20 PM tjackson382000 <tedj1@...> wrote:

I'm sure that at least a few here are familiar with the following section
from the STMicro application note "AN4974: Antenna matching for
ST25R3911B/ST25R391x devices", since it calls for the use of a VNA and the
ST25R391x is an RFID reader chip, supporting several standards. What I'm
confused about is line 4. And I'm not sure of the nanoVNA setting for line
5 (Q factor measurement). Can anyone brief me on what the author is saying
there exactly? I'm by now familiar with the open/short/50ohm calibration
procedure of course, but intermediate level in re-exploring the many curvy
zen mysteries of... the dreaded Smith Chart and applying the procedures
within AN4974.

Also, does anyone here have actual experience with the design of reader
impedance matching and tag antenna design for those chips? In other words,
has anyone ever survived AN4974 and lived to tell about it? Finally, I
need to design an RFID system (I chose the ISO-15693 standard for its
relatively long range, although I would LOVE to hear about any other
standard for which cheap front end chip solutions exist). Requires a 3"
diameter tag antenna and any diameter below 5.5" for the reader antenna and
a read range of up to 10" and must merely read out its unique UID code when
detected. Am I dreaming? Sound feasible? Many thanks to anyone who might
be willing to offer a little experience and advice, and I'd discuss
compensation if an expert is willing.


7.3 Verification of the Q factor in the frequency domain

The Q factor can be measured using a vector network analyzer and an
ISO10373-6 Class 1-3 calibration coil. The following steps should be
carried out:

1. The network analyzer shall be calibrated for a frequency sweep from
about 10 to 20 MHz
2. S11 measurement in log mag format shall be displayed.
3. The calibration coil is connected to the VNA.
4. ¡°Short¡± calibration of the coil and conversion to ¡°Z: Reflection¡±
5. Set marker 1 and enable the bandwidth/Q factor measurement
6. Place the PCD antenna on the measurement coil Note: If the reader is
plugged and powered, ensure that register 0x27 is set to 0xFF to avoid an
high power transfer to the VNA ports, which can damage the VNA.
7. Adjust the suitable trim value via the register map (register 0x21) in
the GUI of the reader
8. Place a 3 ? resistor between the RFO pin to simulate the chip
resistance during operation.
9. Press ¡°max search¡± to align the marker on the resonance frequency peak
of the PCD antenna Figure 33 shows the results of such a measurement.

#applications #coils #design #matching #nanovna





--
*Dave - W?LEV*
*Just Let Darwin Work*
--
Dave - W?LEV


Re: |S11| > 1

 

Brian,
As a reference point, when calibrated, the HP 8753D has a linear magnitude reflection uncertainty of 0.015 or so when the reflection magnitude is near 1.
I am not sure if that means the repeatability is limited to that or if that is due to imperfections of the standards used.
(Source: Quick Reference Guide, 08753-90259, page 7-5)

--John Gord

On Tue, Jun 14, 2022 at 02:45 PM, Brian Beezley wrote:


Measurement of a short at the VNA connector after clearing cal:

49002000 -0.869956992 0.080768176
49126750 -0.869913280 0.080994536
49251500 -0.869870784 0.081221216
49376250 -0.869828352 0.081447216
49501000 -0.869784000 0.081672776
49625750 -0.869736192 0.081898376
49750500 -0.869684800 0.082123680
49875250 -0.869630720 0.082347872
50000000 -0.869575232 0.082570920

After calibrating:

49002000 -1.000384927 -0.000153716
49126750 -1.000387430 -0.000148167
49251500 -1.000389814 -0.000142248
49376250 -1.000392199 -0.000138649
49501000 -1.000394344 -0.000137316
49625750 -1.000395775 -0.000135393
49750500 -1.000395656 -0.000129219
49875250 -1.000393629 -0.000117017
50000000 -1.000389934 -0.000100459

After switching to MA mode. File stayed in RI mode but data changed:

49002000 -0.999972800 0.000051251
49126750 -0.999974336 0.000058021
49251500 -0.999975360 0.000064329
49376250 -0.999976000 0.000067545
49501000 -0.999977344 0.000067800
49625750 -0.999980672 0.000067987
49750500 -0.999986496 0.000071876
49875250 -0.999994304 0.000081417
50000000 -1.000003099 0.000095119

These are excerpts of a 401-point file from 0.1 to 50 MHz. At lower
frequencies the last data set is beyond -1 like the second one.

Observations:

1. |S11| > 1 after calibration.

2. MA mode leaves file in RI mode but affects the data.

Brian


Re: |S11| > 1

 

Settings:

401 points, 0.1-50 MHz, bandwidth 100 Hz, arithmetic 4X smoothing, power = 4 mA

Brian


Re: |S11| > 1

 

Measurement of a short at the VNA connector after clearing cal:

49002000 -0.869956992 0.080768176
49126750 -0.869913280 0.080994536
49251500 -0.869870784 0.081221216
49376250 -0.869828352 0.081447216
49501000 -0.869784000 0.081672776
49625750 -0.869736192 0.081898376
49750500 -0.869684800 0.082123680
49875250 -0.869630720 0.082347872
50000000 -0.869575232 0.082570920

After calibrating:

49002000 -1.000384927 -0.000153716
49126750 -1.000387430 -0.000148167
49251500 -1.000389814 -0.000142248
49376250 -1.000392199 -0.000138649
49501000 -1.000394344 -0.000137316
49625750 -1.000395775 -0.000135393
49750500 -1.000395656 -0.000129219
49875250 -1.000393629 -0.000117017
50000000 -1.000389934 -0.000100459

After switching to MA mode. File stayed in RI mode but data changed:

49002000 -0.999972800 0.000051251
49126750 -0.999974336 0.000058021
49251500 -0.999975360 0.000064329
49376250 -0.999976000 0.000067545
49501000 -0.999977344 0.000067800
49625750 -0.999980672 0.000067987
49750500 -0.999986496 0.000071876
49875250 -0.999994304 0.000081417
50000000 -1.000003099 0.000095119

These are excerpts of a 401-point file from 0.1 to 50 MHz. At lower frequencies the last data set is beyond -1 like the second one.

Observations:

1. |S11| > 1 after calibration.

2. MA mode leaves file in RI mode but affects the data.

Brian


NanoVNA for RFID design

 

I'm sure that at least a few here are familiar with the following section from the STMicro application note "AN4974: Antenna matching for ST25R3911B/ST25R391x devices", since it calls for the use of a VNA and the ST25R391x is an RFID reader chip, supporting several standards. What I'm confused about is line 4. And I'm not sure of the nanoVNA setting for line 5 (Q factor measurement). Can anyone brief me on what the author is saying there exactly? I'm by now familiar with the open/short/50ohm calibration procedure of course, but intermediate level in re-exploring the many curvy zen mysteries of... the dreaded Smith Chart and applying the procedures within AN4974.

Also, does anyone here have actual experience with the design of reader impedance matching and tag antenna design for those chips? In other words, has anyone ever survived AN4974 and lived to tell about it? Finally, I need to design an RFID system (I chose the ISO-15693 standard for its relatively long range, although I would LOVE to hear about any other standard for which cheap front end chip solutions exist). Requires a 3" diameter tag antenna and any diameter below 5.5" for the reader antenna and a read range of up to 10" and must merely read out its unique UID code when detected. Am I dreaming? Sound feasible? Many thanks to anyone who might be willing to offer a little experience and advice, and I'd discuss compensation if an expert is willing.


7.3 Verification of the Q factor in the frequency domain

The Q factor can be measured using a vector network analyzer and an ISO10373-6 Class 1-3 calibration coil. The following steps should be carried out:

1. The network analyzer shall be calibrated for a frequency sweep from about 10 to 20 MHz
2. S11 measurement in log mag format shall be displayed.
3. The calibration coil is connected to the VNA.
4. ¡°Short¡± calibration of the coil and conversion to ¡°Z: Reflection¡±
5. Set marker 1 and enable the bandwidth/Q factor measurement
6. Place the PCD antenna on the measurement coil Note: If the reader is plugged and powered, ensure that register 0x27 is set to 0xFF to avoid an high power transfer to the VNA ports, which can damage the VNA.
7. Adjust the suitable trim value via the register map (register 0x21) in the GUI of the reader
8. Place a 3 ? resistor between the RFO pin to simulate the chip resistance during operation.
9. Press ¡°max search¡± to align the marker on the resonance frequency peak of the PCD antenna Figure 33 shows the results of such a measurement.

#applications #coils #design #matching #nanovna


Re: |S11| > 1

 

On 6/14/22 11:19 AM, DiSlord wrote:
On 4k IFBW as i can see H4 measure error (due to noise) on 100-200MHz near ~1e-4 (on linear trace)
On 100Hz IFBW, near 1e-5
That's "total power" or 1E-4 on I and 1E-4 on Q (so 1.4E-4 on absolute voltage)?


Re: |S11| > 1

 

Jim, I can assure you our STEM students know nothing about significant
figures! Terry (Dr. Terry Bullett) and I have tried, but no knowledge of
the concept. They are Juniors going into their senior year and have had
Chem. and Physics (not "advanced" phys which is seldom taught due to low
demand).

Dave - W?LEV

On Tue, Jun 14, 2022 at 5:49 PM Jim Lux <jim@...> wrote:

On 6/14/22 9:24 AM, W0LEV wrote:
Thank you, Jim!!!

Again, we are not running a metrology lab nor do our measurements
approach
those of HP, R&S, Tek, and others. Something my PhD friends tell me is
that error analysis and assignment of error bars is no longer taught -
not
even at CU/Boulder. I had a required course dedicated to that musing to
obtain my Physics degree some 50+ years ago at Michigan State U.

The students today have no idea how the error bar is established or even
what it truly indicates. Several of us have tried introducing our STEM
students at LTO (Little Thompson Observatory <starkids.org>) to the
concept
of measurement errors and how they affect final outcomes. We usually get
wrinkled foreheads and "why".

Yes, 5 parts in E-5 is -86 dB. Yes, the HP 8753C noise floor can measure
below that. But, not our inexpensive NANOVNAs. Mine typically shows a
noise floor of -60 dB, depending on frequency and measurement type.

Again, thank you to those who put these VNAs at a reachable price in the
hands of us amateurs and those who want to learn the "fine points" of RF
engineering.

Never measure the temperature with more than one thermometer.

Never determine the time of day with more than one Cesium clock.

Never determine _________with more than one _________.

Dave - W?LEV

"sig figs" is taught in high school and undergrad.

If you do any sort of hard science classes they cover measurement
uncertainties as part of the class (e.g. in lab) - Most lab classes
discuss this (Undergrad chem lab certainly does).

The more sophisticated stuff is covered in classes like numerical
analysis - if you're doing signal processing, for instance, round off
and error propagation are a big thing. Same with classes on numerical
solutions of differential equations, in connection with things like
Runge-Kutta. I doubt there's many classes that specifically care about
"calibration uncertainty" - you're on your own with mfr notes and the
professional literature.

As a grad student, you'd be expected to get this knowledge in some way -
there are a variety of short courses offered by various government labs
as well as industry. For instance NIST has annual meeting in certain
fields, and there's often some short courses associated with it.











--
*Dave - W?LEV*
*Just Let Darwin Work*
--
Dave - W?LEV


Re: |S11| > 1

 

On 4k IFBW as i can see H4 measure error (due to noise) on 100-200MHz near ~1e-4 (on linear trace)
On 100Hz IFBW, near 1e-5


Re: |S11| > 1

 

On 6/14/22 9:24 AM, W0LEV wrote:
Thank you, Jim!!!

Again, we are not running a metrology lab nor do our measurements approach
those of HP, R&S, Tek, and others. Something my PhD friends tell me is
that error analysis and assignment of error bars is no longer taught - not
even at CU/Boulder. I had a required course dedicated to that musing to
obtain my Physics degree some 50+ years ago at Michigan State U.

The students today have no idea how the error bar is established or even
what it truly indicates. Several of us have tried introducing our STEM
students at LTO (Little Thompson Observatory <starkids.org>) to the concept
of measurement errors and how they affect final outcomes. We usually get
wrinkled foreheads and "why".

Yes, 5 parts in E-5 is -86 dB. Yes, the HP 8753C noise floor can measure
below that. But, not our inexpensive NANOVNAs. Mine typically shows a
noise floor of -60 dB, depending on frequency and measurement type.

Again, thank you to those who put these VNAs at a reachable price in the
hands of us amateurs and those who want to learn the "fine points" of RF
engineering.

Never measure the temperature with more than one thermometer.

Never determine the time of day with more than one Cesium clock.

Never determine _________with more than one _________.

Dave - W?LEV

"sig figs" is taught in high school and undergrad.

If you do any sort of hard science classes they cover measurement uncertainties as part of the class (e.g. in lab) - Most lab classes discuss this (Undergrad chem lab certainly does).

The more sophisticated stuff is covered in classes like numerical analysis - if you're doing signal processing, for instance, round off and error propagation are a big thing. Same with classes on numerical solutions of differential equations, in connection with things like Runge-Kutta.? I doubt there's many classes that specifically care about "calibration uncertainty" - you're on your own with mfr notes and the professional literature.

As a grad student, you'd be expected to get this knowledge in some way - there are a variety of short courses offered by various government labs as well as industry. For instance NIST has annual meeting in certain fields, and there's often some short courses associated with it.


Re: |S11| > 1

 

Thank you, Jim!!!

Again, we are not running a metrology lab nor do our measurements approach
those of HP, R&S, Tek, and others. Something my PhD friends tell me is
that error analysis and assignment of error bars is no longer taught - not
even at CU/Boulder. I had a required course dedicated to that musing to
obtain my Physics degree some 50+ years ago at Michigan State U.

The students today have no idea how the error bar is established or even
what it truly indicates. Several of us have tried introducing our STEM
students at LTO (Little Thompson Observatory <starkids.org>) to the concept
of measurement errors and how they affect final outcomes. We usually get
wrinkled foreheads and "why".

Yes, 5 parts in E-5 is -86 dB. Yes, the HP 8753C noise floor can measure
below that. But, not our inexpensive NANOVNAs. Mine typically shows a
noise floor of -60 dB, depending on frequency and measurement type.

Again, thank you to those who put these VNAs at a reachable price in the
hands of us amateurs and those who want to learn the "fine points" of RF
engineering.

Never measure the temperature with more than one thermometer.

Never determine the time of day with more than one Cesium clock.

Never determine _________with more than one _________.

Dave - W?LEV

On Tue, Jun 14, 2022 at 12:02 AM Jim Lux <jim@...> wrote:

On 6/13/22 1:31 PM, Brian Beezley wrote:
I've been analyzing Touchstone files Rudy Severns, N6LF, has recorded
with his NanoVNA-H4. The magnitude of S11 is greater than 1 for many files.
For example, after calibration right at the VNA connector, |S11| was 1.0007
maximum for the open cal part itself. For the short the maximum was 1.0005.
For both, |S11| > 1 for all 401 points from 0.1 to 50 MHz.

The images show calculated permittivity and conductivity for a ground
probe with the rods in air. The image with most of the points missing used
uncorrected data. The other image is for normalized data where |S11| = 1
maximum.

Although normalization solves the problem for my software, I'm curious
why |S11| is ever > 1.

Brian

Measurement uncertainty? You're essentially measuring (V refl)/(V
incident) with a noisy sensor. 1 part per 1000 (1.001) is 60dB.. the
SNR of the measurement is in that ballpark.

Calibration peculiarities - you determine the cal coefficients with
noisy measurements, so the combination of cal coefficient high, and
measurement high,.

The ADC measuring the output of the mixer has an ideal SNR of ~90 dB.
It's a 16 bit adc, so there's some quantization uncertainty. Then
there's the arithmetic aspect. The basic software multiplies the ADC
numbers by sin and cos, then sums to get I/Q. That's done with 16 bit
signed integers, 32 bit products, but then truncated before integrating.

There's also the single precision floating point calculation of the
various calibration coefficients using single precision float (32 bit,
with 24 bit mantissa/significand).








--
*Dave - W?LEV*
*Just Let Darwin Work*
--
Dave - W?LEV


Re: |S11| > 1

 

Thanks for the reply, DiSlord. I'll check with Rudy, but I believe he calibrated at the VNA SMA immediately before the measurement since normally he never measures without a cable..

Brian


Re: |S11| > 1

 

On 6/14/22 7:26 AM, Brian Beezley wrote:
I've asked Rudy to remeasure the short and open using MA (magnitude/angle) mode. That might shed some light on where the inaccuracy lies. Also, I think he was using averaging. It might be interesting to disable it.

Brian

what would be interesting is to measure it without calibration, and with, and make sure there's not some mis calibration going on somehow.


Re: |S11| > 1

 

I've asked Rudy to remeasure the short and open using MA (magnitude/angle) mode. That might shed some light on where the inaccuracy lies. Also, I think he was using averaging. It might be interesting to disable it.

Brian


Re: |S11| > 1

 

I think need recalibrate.
Calibration must remove all errors.


Re: |S11| > 1

 

On 6/14/22 4:29 AM, Brian Beezley wrote:
15070000 -1.000470519 -0.000045675
15194750 -1.000452399 -0.000081647
15319500 -1.000464559 -0.000072501
15444250 -1.000433683 -0.000034980
15569000 -1.000416160 -0.000060047
15693750 -1.000486493 -0.000025182
15818500 -1.000452280 -0.000066847
Jim, that's a data sample for the short. The real part is consistently beyond -1.0004. The open is similarly beyond +1. The largest |S11| I found in other .s1p files was 1.0037. I think it is some sort of systematic issue, not noise. Most users will never notice it since the effect is so tiny. My application is sensitive to errors at extreme S11 values, which yield nonphysical results (negative conductivity).

I forgot to mention that the VNA firmware for the open and short was DiSlord 1.2.

Brian

Interesting - I wonder if it's a "round off" or truncation error of some sort.? The "detector" mixes with I/Q 5 kHz, summing, and there could be a 1/2 LSB bias or something like that.

here's the raw I/Q calculation code:

void dsp_process(int16_t *capture, size_t length)

{

uint32_t *p = (uint32_t*)capture;

uint32_t len = length / 2;

uint32_t i;

int32_t samp_s = 0;

int32_t samp_c = 0;

int32_t ref_s = 0;

int32_t ref_c = 0;

for (i = 0; i < len; i++) {

uint32_t sr = *p++;

int16_t ref = sr & 0xffff;

int16_t smp = (sr>>16) & 0xffff;

int32_t s = sincos_tbl[i][0];

int32_t c = sincos_tbl[i][1];

samp_s += smp * s / 16;

samp_c += smp * c / 16;

ref_s += ref * s / 16;

ref_c += ref * c / 16;

}

acc_samp_s = samp_s;

acc_samp_c = samp_c;

acc_ref_s = ref_s;

acc_ref_c = ref_c;

}

raw (uncalibrated) gamma is calculated here

void calculate_gamma(float gamma[2])

{

#if 1

// calculate reflection coeff. by samp divide by ref

float rs = acc_ref_s;

float rc = acc_ref_c;

float rr = rs * rs + rc * rc;

//rr = sqrtf(rr) * 1e8;

float ss = acc_samp_s;

float sc = acc_samp_c;

gamma[0] =(sc * rc + ss * rs) / rr;

gamma[1] =(ss * rc - sc * rs) / rr;

#elif 0

gamma[0] =acc_samp_s;

gamma[1] =acc_samp_c;

#else

gamma[0] =acc_ref_s;

gamma[1] =acc_ref_c;

#endif

}



this is the code that applies the calibration:

if (cal_status & CALSTAT_APPLY)

apply_error_term_at(i);

static void apply_error_term_at(int i)

{

// S11m' = S11m - Ed

// S11a = S11m' / (Er + Es S11m')

float s11mr = measured[0][i][0] - cal_data[ETERM_ED][i][0];

float s11mi = measured[0][i][1] - cal_data[ETERM_ED][i][1];

float err = cal_data[ETERM_ER][i][0] + s11mr * cal_data[ETERM_ES][i][0] - s11mi * cal_data[ETERM_ES][i][1];

float eri = cal_data[ETERM_ER][i][1] + s11mr * cal_data[ETERM_ES][i][1] + s11mi * cal_data[ETERM_ES][i][0];

float sq = err*err + eri*eri;

float s11ar = (s11mr * err + s11mi * eri) / sq;

float s11ai = (s11mi * err - s11mr * eri) / sq;

measured[0][i][0] = s11ar;

measured[0][i][1] = s11ai;

// CAUTION: Et is inversed for efficiency

// S21m' = S21m - Ex

// S21a = S21m' (1-EsS11a)Et

float s21mr = measured[1][i][0] - cal_data[ETERM_EX][i][0];

float s21mi = measured[1][i][1] - cal_data[ETERM_EX][i][1];

float esr = 1 - (cal_data[ETERM_ES][i][0] * s11ar - cal_data[ETERM_ES][i][1] * s11ai);

float esi = - (cal_data[ETERM_ES][i][1] * s11ar + cal_data[ETERM_ES][i][0] * s11ai);

float etr = esr * cal_data[ETERM_ET][i][0] - esi * cal_data[ETERM_ET][i][1];

float eti = esr * cal_data[ETERM_ET][i][1] + esi * cal_data[ETERM_ET][i][0];

float s21ar = s21mr * etr - s21mi * eti;

float s21ai = s21mi * etr + s21mr * eti;

measured[1][i][0] = s21ar;

measured[1][i][1] = s21ai;


Re: New to NanoVNA - HAM wanting to play w. antennas #edy555_nanovna

 

Carsten, my experience is all antennas, even those off the shelf one, need some finetuning.

1. Tuning - I would recommend the minimal height for tuning purposes is 3-4m over the ground at the end of the antenna and 1.5-2m at the transformer side.
The higher side could be done such you simply put a stone at the end of the parachute cord, and throw it over the tree - you may then move the end of the antenna up and down easily by pulling the stone.
The tuning of the 40/20/15/10m band is easier, as the "tuning sensitivity" there is lower (do not cut off more than 5cm of wire at once), the 80m piece of wire after the 110uH coil is extremely sensitive though - like 5kHz/cm, and, most important information - the Bandwitdh of the 80m band portion with that specific antenna is pretty narrow - like 40-50kHz, this is what you have to decide upfront - where you want to place that 80m segment (it is from 3500-3800kHz and you will place yourself into a 40-50kHz wide segment of it). That is caused by the resonant LC behavior of the 110uH coil and the aprox 2m long wire (acting as the parasitic Capacitor)..
The antenna de-tunes itself a little bit when pulled into higher height after the tuning, how much - it depends on many factors, however.
The transformer - its mounting is also important - as the output of the transformer (where you connect the antenna wire) is extremely sensitive to parasitic capacitancies, it should be at least 20cm off any other parts, especially metal ones.

2. The shape: the "V" horizontal shape will not hurt the swr too much, afaik, but the radiation pattern diagram (which is difficult to plan either - as it depends heavily on the band and the surrounding objects).


Re: Using a nanoVNA as a passive receiver

 

I tried this just last week. It seems work like a spectrum analyzer but having doubts about calibration. For this purpose I used Satsagen software and my HackRF One.
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ALVARO, EA8ARX