Thanks Jeff;
Too many new tools tied to learning about this. I don¡¯t know which one to learn first. :-)
I¡¯m seeing universal agreement on the equivalence of the computations, so I¡¯m comfortable that I can set anchor for my understanding at this point.
I think the nuance that GIN&PEZ may be attempting to communicate; is the influence or perhaps lack of influence of calibration on the uncertainties in the final result.
They utilize what they define as differential error regions and intervals to predict the limits of uncertainty, and I think they are comparing measurements using nominal value estimates for the NanoVNA¡¯s OEM standards with measurements made using high quality HP standards and their respective characterized correction values. Those results are also evaluated to assess their containment within the predicted error region.
--
73
Gary, N3GO
