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Re: 2port measurement determining Zdut with S11 and S21


 

Thanks Roger and Owen,

Remember that the S11 formula from
and NanoVNA Saver (and my own
Excel spreadsheets) already takes away the 50ohm (Zload) of port 2.
The S11 2-port series through measurement (also described by k6jca,
NaonoVNA Saver and earlier link), is always close to the S11 1-port
measurement.

My calibration plane is at the end of the middle/earth tips of the PCB SMA
connector (also my calibration kit is at these tips:
). I solder the
DUT directly to these pins aka calibration plane (so no real extension of
the plane). This all to minimize variability of reference plane
capacitance/etc.

In my case Zload of port2 is very close to on average 50.8-0.1i ohm (300kHz
to 30MHz), which is based on a calibration load of 49.7 ohm (using DVM,
accuracy 1.5%). As my Calibration-load is a little smaller than 50~0iohm,
the resistances measured by the NanoVNA will be a little too high. So my
Zload comes closer to 50ohm. Anyway I compensate S21 for that Zload.
In my case Zsource is significantly different (on average 43.6+3.2iohm)
from 50ohm. So I compensate S21 for that (using Owen's method:
), S11 is not affected by this Zsource
as Zsource is calibrated 'out' by Calibration-load.

I put the DUT on a styrofoam underground (to minimize the effects of my
wooden table top's dielectricum). I also put a clip-on ferrite on the port1
or port2 wire, or shortened the port2 cable (from 16cm to 2cm), or put it
as far away from other equipment (the NanoVNA is though always some 16cm
nearby: IMG_1643.jpg). All these changes don't really have an effect on
2port series through measurements of S11 or S21. Only slightly at the end
of my measurement range (30MHz).
The DUT (in 2 port series through) has *certainly* hand effect (aka adding
stray capacitance), so I need to stay way;-). This hand effect is most
prominent on the S21 (not much on the S11) 2-port series through.

If I change the offset delay, this has almost no effect on S21 2port series
through (as expected), but on the S11 2port series through (it shifts the R
and X peaks to higher frequencies). If I put the offset delay to around
-56ps equivalent to 7.5mm, the R&X peaks of S11 map the R&X peaks of S21.
The below screengrab is with a offset delay of -56ps:
[image: afbeelding.png]
I still find it strange that while the S21 changes so much the S11 stays
quite constant. If I understand k6jca (


), he (as some other experts) likes S21 the best (also more stable than
S11...) for high impedances (like for chokes at say 10kohm). This makes it
even more confusing as others now tell me S11 is better;-)
It would be nice to use Benson's Y method; but that needs a S11, S21, S12,
S22 setup (and with that a 12-term calibration). This is not available with
NanoVNA, so that does not help as advice. Perhaps in a few years prices
will go down for such equipment;-)

I will digest k6jca pages in more detail (I recognise some of what he is
telling, looking at my own experiences).

Thanks for all the feedback provided. If I gain more experience, I will
communicate over the group.

All the best,

Victor

Op za 11 jun. 2022 om 20:08 schreef Roger Need via groups.io <sailtamarack=
[email protected]>:

Others have found similar issues using the S21 series method using the
NanoVNA and even with higher performance HP VNA equipment. Here are some
interesting links. The K6JCA experiments find differences similar to what
you have measured.






In my experiments I found that parasitic capacitance had considerable
affect on the S21 measurements and I tried several different test jigs to
see what happened. The issue of where to establish the reference plane
took some consideration. S21 Gain and S21 phase determine the complex
impedance of the DUT and even with some type of source (Port1) and
termination (Port2) correction the phase was often incorrect. Phase
measurement was the problem and in my tests was due to an offset delay
across the jig. Another issue I found was that for some reason high DUT
impedance resulted in common mode current on the surface of the coax cables
connecting the NanoVNA to the test jig. I tried snap-on ferrites and the
results changed.

You mentioned that you could do a S11 reflection and S21 series
measurement at the same time. You will get different results when the DUT
is in series between Port 1 and Port2 compared to when it is across Port 1
alone. Best case is that it will be 50 ohms higher. TIn reality the
complex impedance measured when in series is the DUT plus the input
impedance of the cable attached to Port 2 (which will deviate from 50 ohms
due to Port 2 impedance not being 50 ohms) and any parasitic inductance or
capacitance between the DUT and the Port 2 cable.

I wish you good luck in your quest and hope you find a method that works
for you and that you find a solution that eluded me.

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